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IEEE Press Series on Microelectronic Systems
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Computer science
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Paper book «Reliability Wearout Mechanisms in Advanced CMOS Technologies», authors Alvin W. Strong, Ernest Y. Wu, Giuseppe La Rosa, Jordi Sune, Rolf-Peter Vollertsen, Stewart E. Rauch, Timothy D. Sullivan – фото №1
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Reliability Wearout Mechanisms in Advanced CMOS Technologies
Alvin W. Strong Alvin W. Strong, Ernest Y. Wu, Giuseppe La Rosa, Jordi Sune, Rolf-Peter Vollertsen, Stewart E. Rauch, Timothy D. Sullivan
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